Rsrc
J-GLOBAL ID:201110081158323819   Research Resource code:5000004287 Update date:Jan. 20, 2006

構造・組成分析装置

構造・組成分析装置
Owning Organization:
Contact: OHSHIMA Shigetoshi
Resource classification: Others
Research area  (1): Electron/electric material engineering
Overview:
Structural and compositional analysis equipment: main
use for microscopic composition analysis and structural
analysis on the surface of semiconductor and
superconductor materials
(1) Composition analysis: scanning Auger microprobe
analyzer
(2) Structural analysis: X-ray and electron
diffractometers
Research field : Electronic and Electric Materials Engineering
User procedures and method:
Charge for use: Contact the person in charge for further
information.
Charge for use: free (consumables to be charged at
actual cost)
Qualification of user: researcher registered as a joint
use researcher

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