Rsrc
J-GLOBAL ID：201110088947228345
Research Resource code：1000002156
Update date：Dec. 15, 2003
Atomic Force Microscopy.
AFM(原子間力顕微鏡)
Owning Organization：
Contact：
TAKAHASHI Mitsuo, HIRATA Fusao
Resource classification：
Experience equipment, Facilities, etc
Research area (2)：
Science education
, Thin film and surface interface physical properties
Overview：
AFM
Research field ：
Oxygen sensor
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