Rsrc
J-GLOBAL ID:201110088947228345   Research Resource code:1000002156 Update date:Dec. 15, 2003

Atomic Force Microscopy.

AFM(原子間力顕微鏡)
Owning Organization:
Contact: TAKAHASHI Mitsuo, HIRATA Fusao
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Science education ,  Thin film and surface interface physical properties
Overview:
AFM
Research field : Oxygen sensor

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