Rsrc
J-GLOBAL ID:201110092632542782   Research Resource code:5000003840 Update date:Nov. 01, 2005

Advanced Materials Science Center

先端材料科学センター
Owning Organization:
Contact: OHNISHI Kazunori
Resource classification: Experience equipment, Facilities, etc
Research area  (4): Physical properties II ,  Inorganic industrial material ,  Applied physical properties/crystal engineering ,  Thin film and surface interface physical properties
Overview:
(1)電界放射型透過電子顕微鏡(FE-TEM)
(2)X線マイクロアナライザー(EPMA)
(3)X線光電子分光装置(ESCA)
(4)集束イオンビーム加工装置(FIB)
(5)振動試料型磁力計(VSM)
(6)SPM (AFM, MFM, STM)
(7)電界放射型走査電子顕微鏡(FE-SEM)
(8)走査電子顕微鏡付高温疲労試験機(SEMサーボパルサ)
User environment and conditions:
1.Cooperative Research 2.General Research 3.Subsidized Research 4.SpecialResearch 5.Invited Research 6.Projected Research 7.Contributed Research
User procedures and method:
上記機器による分析を伴う材料研究について、広く共同研究等の相談
に応じるので、詳細は担当者までご連絡下さい。

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