Rsrc
J-GLOBAL ID:201110099899577393   Research Resource code:1000000242 Update date:Jan. 27, 2005

高分解能ナノ分析電子顕微鏡装置

高分解能ナノ分析電子顕微鏡装置
Owning Organization:
Contact: SUGAWARA Shigeo
Resource classification: Experience equipment, Facilities, etc
Research area  (1): Composite materials/physical properties
Overview:
High resolution nano analysis electron microscope
Main purpose: Observation of microscopic defects in
metals, semiconductora, organic materials, and
ceramics; elemental analysis in submicro-scales, and
narrowing down to a nanometer level of the electron
beam diameter, and qualitative and quantitative
analysis on microscopic scales.
(1) High resolution nano analysis microscopy
(2) Energy dispersive X-ray analyzer
(3) Cooling water system
(4) Dual ion milling device
Research field : Composed Materials and Properties
User environment and conditions:
Only if our research is not affected.
User procedures and method:
Procedure of use: For a detailed information of use,
contact our center.
Charge: 200 yen/hour
Necessary qualification for use: Coworkers of the
university
Constraints on use: Nothing in particular.

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