Art
J-GLOBAL ID：201202246486759131   Reference number：12A1466417

Real-Time Soft-Error Testing of 40nm SRAMs

40nm SRAMsのリアルタイム・ソフトエラー試験
Author (9)：
AUTRAN J.L.

About AUTRAN J.L.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
SERRE S.

About SERRE S.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
MUNTEANU D.

About MUNTEANU D.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
MARTINIE S.

About MARTINIE S.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
SEMIKH S.

About SEMIKH S.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
SAUZE S.

About SAUZE S.

(Aix-Marseille Univ., Marseille, FRA)

About Aix-Marseille Univ., Marseille, FRA

, 
UZNANSKI S.

About UZNANSKI S.

(STMicroelectronics, Crolles, FRA)

About STMicroelectronics, Crolles, FRA

, 
GASIOT G.

About GASIOT G.

(STMicroelectronics, Crolles, FRA)

About STMicroelectronics, Crolles, FRA

, 
ROCHE P.

About ROCHE P.

(STMicroelectronics, Crolles, FRA)

About STMicroelectronics, Crolles, FRA


Material：
Annual Proceedings. IEEE International Reliability Physics Symposium  (IRPS)

About Annual Proceedings. IEEE International Reliability Physics Symposium


Volume： 2012 Vol.1  Page： 257-265  Publication year： 2012 
JST Material Number： A0631A  ISSN： 1541-7026  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
test

About test

, 
error rate

About error rate

, 
soft error

About soft error

, 
time

About time

, 
*SRAM

About SRAM

, 
wiring

About wiring

, 
alpha particle

About alpha particle

, 
neutron

About neutron

, 
*electronic circuit

About electronic circuit

, 
reliability(property)

About reliability(property)


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ソフトエラー試験

About ソフトエラー試験

, 
real time

About real time


JST classification (2)：
JST classification
Category name(code) classified by JST.
Memory units 
(JC04060F)

About Memory units

,  Electronic circuits in general 
(NC05010N)

About Electronic circuits in general

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
リアルタイム

About リアルタイム

, 
ソフトエラー

About ソフトエラー

, 
試験

About 試験


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