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J-GLOBAL ID:201202252499025927   Reference number:12A1035618

Experimental Evidence for Epitaxial Silicene on Diboride Thin Films

二ホウ化物薄膜上のエピタキシャルシリセンについての実験的証拠
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Volume: 108  Issue: 24  Page: 245501.1-245501.5  Publication year: Jun. 15, 2012 
JST Material Number: H0070A  ISSN: 0031-9007  CODEN: PRLTAO  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Surface structure of semiconductors 
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