Art

J-GLOBAL ID：201202297363571212   Reference number：12A0565111

Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope

透過型電子顕微鏡中のナノ材料工学および特性研究

Author (16)： GOLBERG Dmitri (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  COSTA Pedro M. F. J. (Univ. Aveiro, Aveiro, PRT) ,  COSTA Pedro M. F. J. (IFW, Dresden, DEU) ,  WANG Ming-Sheng (Massachusetts Inst. Technol., MA, USA) ,  WEI Xianlong (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  TANG Dai-Ming (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  TANG Dai-Ming (Inst. Metal Res., Chinese Acad. Sci., Shenyang, CHN) ,  XU Zhi (Inst. Physics, Chinese Acad. Sci., Beijing, CHN) ,  HUANG Yang (Univ. Queensland, QLD, AUS) ,  GAUTAM Ujjal K. (Jawaharlal Nehru Centre for Advanced Scientific Res. (JNCASR), Bangalore, IND) ,  LIU Baodan (Dalian Univ. Technol., Dalian, CHN) ,  ZENG Haibo (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  KAWAMOTO Naoyki (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  ZHI Chunyi (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  MITOME Masanori (National Inst. Materials Sci. (NIMS), Ibaraki, JPN) ,  BANDO Yoshio (National Inst. Materials Sci. (NIMS), Ibaraki, JPN)
Material： Advanced Materials  (Adv Mater (Deerfield, Fla.))
Volume： 24  Issue： 2  Page： 177-194  Publication year： Jan. 10, 2012 
JST Material Number： W0001A  ISSN： 0935-9648  CODEN： ADVMEW  Document type： Article
Article type： 文献レビュー  Country of issue： Germany, Federal Republic of (DEU)  Language： ENGLISH (EN)

Thesaurus term： *transmission electron microscope ,  *nanostructure ,  material ,  *material testing ,  atomic force microscope ,  scanning tunneling microscope ,  complex system ,  carbon nanotube ,  nanotube ,  encapsulation ,  metal ,  inorganic material ,  phase transition ,  mechanical quantity ,  Electronics ,  boron nitride ,  bending test (bending) ,  tensile test ,  nanowire ,  *electrical property ,  *mechanical property ,  monolayer ,  Graphite ,  reduction (reaction) ,  ribbon crystal ,  membrane and film ,  *nanotechnology ,  field emission ,  conductor ,  switch ,  doping ,  electrical conductivity ,  Thermometry ,  locality ,  graphene ,  nanomaterial ,  nanosheet ,  ion conductor ,  nanoswitch ,  nanoribbon ,  material characteristics ,  graphene oxide ,  *property
Semi thesaurus term： electronics ,  composite system

JST classification (4)： Microscopy determination of structures  (BK01040E) ,  Strength of materials in general  (HC01000U) ,  Laboratory techniques and instrumentation systems in physis in general  (BA02010A) ,  Experimental research on molecular structure and properties  (CB01020I)

Terms in the title (3)： 透過型電子顕微鏡 ,  材料工学 ,  研究