Art

J-GLOBAL ID：201302206542637058   Reference number：13A0658706

信頼性と人材育成-発光デバイスの例-

Author (1)： UEDA OSAMU (金沢工大)
Material： 日本信頼性学会誌  (REAJ誌)
Volume： 35  Issue： 2  Page： 89-97  Publication year： Mar. 01, 2013 
JST Material Number： L2778A  ISSN： 0919-2697  Document type： Article
Article type： 解説  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： reliability (property) ,  *industrial education ,  *manpower training ,  *light emitting diode ,  *semiconductor laser ,  reliability analysis ,  failure rate ,  reliability test ,  engineering education ,  light-emitting device ,  education
Semi thesaurus term： education in corporation ,  *engineer education ,  *信頼性技術者 ,  light-emitting device ,  quality degradation

JST classification (3)： Engineering education  (KA01050U) ,  Engineering education  (NA01040M) ,  Measurement,testing and reliability of solid-state devices  (NC03040G)

Reference (9)：

• UEDA, O. On degradation studies of III-V compound semiconductor optical devices over three decades : focusing on gradual degradation. Jpn. J. Appl. Phys. 2010, 49, 9, "090001-1"-"090001-2"
• UEDA, O. Degradation of III-V opto-electronic devices. J. Electrochem. Soc. 1988, 135, 1, 11C-22C
• FUKUDA, M. Reliability and Degradation of LEDs and Semiconductor Lasers. 1991
• UEDA, O. Reliability and degradation of III-V optical devices. 1996
• GUHA, S. Degradation of II-VI based blue-green light emitters. Appl. Phys. Lett. 1993, 63, 23, 3107-3109

Terms in the title (2)： 人材育成 ,  発光デバイス