Art

J-GLOBAL ID：201302279378888050   Reference number：13A0529717

Round Addition Using Faults for Generalized Feistel Network

一般化フェイステルネットワークのための故障を使用するラウンドアディション

Author (3)： YOSHIKAWA Hideki (Fac. of Engineering, Tohoku Gakuin Univ.) ,  KAMINAGA Masahiro (Fac. of Engineering, Tohoku Gakuin Univ.) ,  SHIKODA Arimitsu (Fac. of Engineering, Tohoku Gakuin Univ.)
Material： IEICE Transactions on Information and Systems (Institute of Electronics, Information and Communication Engineers)  (IEICE Trans Inf Syst (Inst Electron Inf Commun Eng))
Volume： E96-D  Issue： 1  Page： 146-150 (J-STAGE)  Publication year： 2013 
JST Material Number： L1371A  ISSN： 0916-8532  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *network ,  *failure ,  cryptography key ,  sentence ,  whitening ,  microcontroller ,  feasibility ,  analysis ,  difference
Semi thesaurus term： whitening ,  code text ,  secret key

JST classification (2)： Communication network  (ND07030A) ,  Other information processing  (JE15050M)

Reference (8)：

• [1] E. Biham and A. Shamir, “Differential fault analysis of secret key cryptosystems,” Proc. CRYPTO'97, LNCS 1294, pp.513-525, 1997.
• [2] H. Choukri and M. Tunstall, “Round reduction using faults,” Proc. FDTC, pp.13-24, 2005.
• [3] J. Park, S. Moon, D. Choi, Y. Kang, and J. Ha, “Differential fault analysis for round-reduced AES by fault injection,” ETRI J., vol.33, no.3, pp.434-441, June 2011.
• [4] J. Takahashi and T. Fukunaga, “Differential fault analysis on CLEFIA with 128, 192, and 256-bit keys,” IEICE Trans. Fundamentals, vol.E93-A, no.1, pp.136-143, Jan. 2010.
• [5] R. Li, B. Sun, C. Lin, and J. You, “Differential fault analysis on SMS4 using single fault,” Inf. Process. Lett., vol.111, pp.156-163, 2011.

Terms in the title (2)： 一般化 ,  故障