Art

J-GLOBAL ID：201402220197549973   Reference number：14A1122205

A simple way to obtain backscattered electron images in a scanning transmission electron microscope

走査透過型電子顕微鏡での後方散乱電子像の単純な取得法

Author (4)： TSURUTA Hiroki (Nagoya Univ., Nagoya, JPN) ,  TANAKA Shigeyasu (Nagoya Univ., Nagoya, JPN) ,  TANJI Takayoshi (Nagoya Univ., Nagoya, JPN) ,  MORITA Chiaki (Meijo Univ., Nagoya, JPN)
Material： Microscopy
Volume： 63  Issue： 4  Page： 333-336  Publication year： Aug. 2014 
JST Material Number： W1384A  ISSN： 2050-5698  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *scanning transmisson electron microscope ,  ion etching ,  *electron beam ,  Latex ,  paste ,  *backward scattering ,  lattice ,  detector ,  *Si semiconductor detector ,  Aluminum ,  Titanium ,  opening ,  electrode

JST classification (1)： Electron and ion microscopes  (BD02050B)

Reference (4)：

• Reimer L (1984) Scanning Electron Microscope. Springer Series in Optical Sciences (Springer-Verlag, Berlin Heidelberg New York Tokyo).
• Bogner A, Thollet G, Basset D, Jouneau P, Cauthier C (2005) Wet STEM: a new development in environmental SEM for imaging nano-objects included in a liquid phase. Ultramicroscopy 104: 290-301.
• Suga M, Nishiyma H, Ebihara T (2009) Atmospheric electron microscope: limits of observable depth. Microsc. Microanal. 15: 294-295.
• Nishiyama H, Suga M, Ogura T, Maruyama Y, Koizumi M, Mio K, Kitamura S, Sato C (2010) Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film. J. Struct. Biol. 169: 438-449.

Terms in the title (3)： 走査透過型電子顕微鏡 ,  後方散乱 ,  電子