Art
J-GLOBAL ID：201502200242341650   Reference number：15A0898218

Some Basic Properties of the Failure Rate of Redundant Reliability Systems in Industrial Electronics Applications

工業エレクトロニクス分野における冗長信頼性システムの故障率の幾つかの基本特性
Author (2)：
CHIODO Elio

About CHIODO Elio

(Univ. Naples Federico II, Naples, ITA)

About Univ. Naples Federico II, Naples, ITA

, 
LAURIA Davide

About LAURIA Davide

(Univ. Naples Federico II, Naples, ITA)

About Univ. Naples Federico II, Naples, ITA


Material：
IEEE Transactions on Industrial Electronics  (IEEE Trans Ind Electron)

About IEEE Transactions on Industrial Electronics


Volume： 62  Issue： 8  Page： 5055-5062  Publication year： Aug. 2015 
JST Material Number： C0234A  ISSN： 0278-0046  CODEN： ITIED6  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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*electronic equipment

About electronic equipment

, 
*redundant system

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, 
reliability analysis

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, 
*failure rate

About failure rate

, 
exponential distribution

About exponential distribution

, 
Weibull distribution

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, 
characteristic curve

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, 
bath-tub curve of plant

About bath-tub curve of plant


JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
工業

About 工業

, 
エレクトロニクス

About エレクトロニクス

, 
信頼性システム

About 信頼性システム

, 
故障率

About 故障率


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