Art
J-GLOBAL ID:201502212070744119   Reference number:15A0222818

Direct observation of electron emission and recombination processes by time domain measurements of charge pumping current

電荷ポンピング電流の時間領域測定による電子放出過程と再結合過程の直接観測
Author (4):
Material:
Volume: 106  Issue:Page: 041603-041603-4  Publication year: Jan. 26, 2015 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (1):
JST classification
Category name(code) classified by JST.
Transistors 
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page