Art

J-GLOBAL ID：201502220574666368   Reference number：15A1289250

Copper Ion-containing Ionic Liquids Provide Improved Endurance and Switching Voltage Distributions of Conducting-bridge Random Access Memory

銅イオン含有イオン液体により導電性ブリッジランダムアクセスメモリの改良された耐性とスイッチング電圧分布が得られる

Author (10)： HARADA Akinori (Dep. of Chemistry and Biotechnology, Graduate School of Engineering, Tottori Univ.) ,  YAMAOKA Hiroki (Dep. of Chemistry and Biotechnology, Graduate School of Engineering, Tottori Univ.) ,  WATANABE Kouhei (Dep. of Information and Electronics, Graduate School of Engineering, Tottori Univ.) ,  KINOSHITA Kentaro (Dep. of Information and Electronics, Graduate School of Engineering, Tottori Univ.) ,  KISHIDA Satoru (Dep. of Information and Electronics, Graduate School of Engineering, Tottori Univ.) ,  FUKAYA Yukinobu (Center for Res. on Green Sustainable Chemistry, Graduate School of Engineering, Tottori Univ.) ,  NOKAMI Toshiki (Dep. of Chemistry and Biotechnology, Graduate School of Engineering, Tottori Univ.) ,  NOKAMI Toshiki (Center for Res. on Green Sustainable Chemistry, Graduate School of Engineering, Tottori Univ.) ,  ITOH Toshiyuki (Dep. of Chemistry and Biotechnology, Graduate School of Engineering, Tottori Univ.) ,  ITOH Toshiyuki (Center for Res. on Green Sustainable Chemistry, Graduate School of Engineering, Tottori Univ.)
Material： Chemistry Letters  (Chem Lett)
Volume： 44  Issue： 11  Page： 1578-1580 (J-STAGE)  Publication year： 2015 
JST Material Number： S0742A  ISSN： 0366-7022  CODEN： CMLTAG  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *RAM ,  *metal ion ,  *copper compound ,  *ionic liquid ,  *resistance(endure) ,  *switching ,  *distribution ,  cycle life ,  hafnium oxide ,  copper ,  platinum
Semi thesaurus term： *random access memory ,  *copper ion ,  *voltage distribution

JST classification (3)： Molten salts  (CB05050R) ,  Imidazoles  (CF07083X) ,  Memory units  (JC04060F)

Substance index (2)： 1-Butyl-3-methylimidazolium ,  Bis(trifluoromethanesulfon)imide

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Terms in the title (8)： 銅イオン ,  イオン液体 ,  導電性 ,  ブリッジ ,  ランダムアクセスメモリ ,  耐性 ,  スイッチング ,  電圧分布