Art

J-GLOBAL ID：201502224024392478   Reference number：15A0327374

Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy

Kelvinプローブ力顕微鏡法による電極上の有機多層膜の表面電位測定

Author (6)： SATOH Nobuo (Kyoto Univ.) ,  SATOH Nobuo (Chiba Institure of Technol.) ,  KATORI Shigetaka (Kyoto Univ.) ,  KOBAYASHI Kei (Kyoto Univ.) ,  MATSUSHIGE Kazumi (Kyoto Univ.) ,  YAMADA Hirofumi (Kyoto Univ.)
Material： IEICE Transactions on Electronics (Web)  (IEICE Trans Electron (Web))
Volume： E98.C  Issue： 2  Page： 91-97 (J-STAGE)  Publication year： 2015 
JST Material Number： U0468A  ISSN： 1745-1353  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *light emitting diode ,  organic semiconductor ,  *multilayer film ,  semiconductor thin film ,  surface potential ,  electrical measurement ,  microscopy ,  evaporated film
Semi thesaurus term： Kelvin probe force microscopy

JST classification (1)： Light emitting devices  (NC03082G)

Reference (26)：

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• [2] Y. Gao, “Surface analytical studies of interfaces in organic semiconductor devices,” Mater. Sci. Eng. Rep., vol.68, no.3, pp.39–87, 2010.
• [3] I. G. Hill, A. J. Mäkinen, and Z. H. Kafafi, “Initial stages of metal/organic semiconductor interface formation,” J. Appl. Phys., vol.88, no.2, pp.889, 2000.
• [4] C. W. Tang and S. A. VanSlyke, “Organic electroluminescent diodes,” Appl. Phys. Lett., vol.51, no.12, pp.913, 1987.
• [5] J. Kido, M. Kimura, and K. Nagai, “Multilayer white light-emitting organic electroluminescent device,” Science, vol.267, no.5202, pp.1332–1334, 1995.

Terms in the title (3)： Kelvinプローブ力顕微鏡法 ,  多層膜 ,  電位測定