Art

J-GLOBAL ID：201502267370910010   Reference number：15A0163227

Recent Activity of International Comparison for Nanoparticle Size Measurement

ナノ粒子サイズ測定のための国際的な比較の最近の活動

Author (6)： TAKAHASHI Kayori (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  TAKAHATA Keiji (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  MISUMI Ichiko (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  SUGAWARA Kentaro (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  GONDA Satoshi (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  EHARA Kensei (National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
Material： Proceedings of SPIE  (Proceedings. SPIE - The International Society for Optical Engineering)
Volume： 9232  Page： 92320L.1-92320L.5  Publication year： 2014 
JST Material Number： D0943A  ISSN： 0277-786X  CODEN： PSISDG  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *dynamic light scattering ,  *nano particle ,  *particle size(diameter) ,  measurement ,  *polystyrene ,  *latex ,  *suspension(disperse system) ,  *uncertainty ,  diffusion coefficient ,  atomic force microscope ,  scanning electron microscope ,  dynamic mechanical analysis
Semi thesaurus term： DMA(analysis)

JST classification (1)： Measuring methods and instruments of length,area,cross section,volume,angle  (AD05020O)

Terms in the title (2)： 粒子サイズ測定 ,  活動