Art

J-GLOBAL ID：201502278914867999   Reference number：15A0546024

Influence of an AC-coaxial adapter on measurements of the AMN impedance

AC同軸アダプタがAMNインピーダンス測定に及ぼす影響

Author (4)： SHINOZUKA Takashi (National Inst. of Information and Communications Technol.) ,  FUJII Katsumi (National Inst. of Information and Communications Technol.) ,  SUGIURA Akira (Graduate School of Engineering, Kyoto Univ.) ,  WADA Osami (Graduate School of Engineering, Kyoto Univ.)
Material： IEICE Communications Express (Web)  (IEICE Commun Express (Web))
Volume： 4  Issue： 3  Page： 99-104 (J-STAGE)  Publication year： 2015 
JST Material Number： U0397A  ISSN： 2187-0136  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *electromagnetic compatibility(interference) ,  *electric circuit ,  *network ,  *electrical measurement ,  alternating current ,  coaxial cable ,  adapter ,  mode ,  impedance ,  parameter estimation ,  correction(modification)
Semi thesaurus term： *EMC ,  S parameter ,  *impedance measurement ,  circuit network ,  modified method ,  power supply circuit

JST classification (2)： Noise theory  (ND04020U) ,  Noise measurement  (ND04030F)

Reference (5)：

• [1] CISPR 16-1-2, ed. 1.2: Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-2 Radio disturbance and immunity measuring apparatus - Ancillary equipment - Conducted disturbances, 2006.
• [2] T. Williams and G. Orford, Calibration and use of artificial mains networks and absorbing clamps, Report DTI-NMSPU project FF2.6, Schaffner-Chase EMC Ltd., 1998.
• [3] M. Borsero, C. Pravato, A. Sona, M. Stellini, and A. Zuccato, “Improved adapters for the accurate calibration of LISN input impedance,” Proc. 18^th Int’l Zurich Symp. on EMC (EMC Zurich 2007), pp. 489-492, 2007. DOI:10.1109/EMCZUR.2007.4388302
• [4] A. Sugiura and Y. Kami, “Generation and propagation of common-mode currents in a balanced two-conductor line,” IEEE Trans. Electromagn. Compat., vol. 54, no. 2, pp. 466-473, April 2012. DOI:10.1109/TEMC.2011.2162523
• [5] D. E. Bockelman and W. R. Eisenstadt, “Combined differential and common-mode scattering parameters: theory and simulation,” IEEE Trans. Microw. Theory Techn., vol. 43, no. 7, pp. 1530-1539, July 1995. DOI:10.1109/22.392911

Terms in the title (5)： Ac ,  同軸 ,  アダプタ ,  AMN ,  インピーダンス測定