J-GLOBAL ID:201601007234412432   Update date: Sep. 27, 2022


Research field  (2): Machine elements and tribology ,  Design engineering
Papers (14):
Patents (3):
  • Atomic Force Microscope under High Temperature and Humidity and In-situ Observation Device for Chemical Reaction
  • In-situ Detection Tester for Thin Film Peeling
  • Adhesion Tester
Lectures and oral presentations  (2):
  • Adhesion Measurement for Cu and Al patterned wiring and electrode films
    (Research reports 2007)
  • Stability of the unidirectional anisotropy for exchange coupled bilayer films
    (日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan 1997)
Education (2):
  • 1975 - 1980 Waseda University Graduate School, of Science and Engineering
  • 1976 - 1977 Waseda University Faculty of Science and Engineering
Work history (4):
  • - 現在 Ashikaga Institute of Technology Professor
  • 1985/04 - 2006/03 Nippon Denki Co.,Ltd.
  • 1980/04 - 1985/03 Waseda University Faculty of Sciennce and Engineering Assistant
  • Ashikaga Institute of Technology Faculty of EngineeringDepartment of Innovative Engineering,Division of Mechanical Engineering
Committee career (1):
  • 2009/02 - 現在 (独)新エネルギー・産業技術開発機構 技術委員
Awards (2):
  • 1998/04 - Science and Technology Agency of Japan Science and Technology Agency Award Development of Adhesion Tester for Thin Film
  • 1991/07 - Japan Society for the Promotion of Machine Industry Award of Japan Society for the Promotion of Machine Industry Development of Mechanical Property Tester frr Sub-micron Thin Films
Association Membership(s) (1):
Japan Society of Applied Physics
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