Atomic Force Microscope under High Temperature and Humidity and In-situ Observation Device for Chemical Reaction
In-situ Detection Tester for Thin Film Peeling
Adhesion Tester
Lectures and oral presentations (2)：
Adhesion Measurement for Cu and Al patterned wiring and electrode films
(Research reports 2007)
Stability of the unidirectional anisotropy for exchange coupled bilayer films
(日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan 1997)
Education (2)：
1975 - 1980 Waseda University Graduate School, of Science and Engineering
1976 - 1977 Waseda University Faculty of Science and Engineering
Work history (4)：
- 現在 Ashikaga Institute of Technology Professor
1985/04 - 2006/03 Nippon Denki Co.,Ltd.
1980/04 - 1985/03 Waseda University Faculty of Sciennce and Engineering Assistant
Ashikaga Institute of Technology Faculty of EngineeringDepartment of Innovative Engineering,Division of Mechanical Engineering
Committee career (1)：
2009/02 - 現在 (独)新エネルギー・産業技術開発機構 技術委員
Awards (2)：
1998/04 - Science and Technology Agency of Japan Science and Technology Agency Award Development of Adhesion Tester for Thin Film
1991/07 - Japan Society for the Promotion of Machine Industry Award of Japan Society for the Promotion of Machine Industry Development of Mechanical Property Tester frr Sub-micron Thin Films
