Art
J-GLOBAL ID：201602002745989624 Reference number：58A0069195
The Use of Sweep-Frequency Beckscatter Data for Determining Oblique-Incidence Ionospheric Characteriatics.
掃引周波数の背面散乱データの使用-斜入射電離層特性の決定
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Author (1)：
SILBERSTEIN R
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Material：
J Geophys Res (Journal of Geophysical Research)
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Volume：
63
Issue：
2
Page：
335-351
Publication year：
1958
JST Material Number：
C0294A
ISSN：
0148-0227
CODEN：
JJGRDA
Document type：
Article
Country of issue：
United States (USA)
JST classification (1)：
JST classification
Category name(code) classified by JST.
(GF040104)
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Terms in the title (5)：
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掃引
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背面
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散乱
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斜入射
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電離層
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