Art
J-GLOBAL ID：201602002776443905   Reference number：70A0004548

Moire gauging using optical interference patterns.

光学的干渉パターンを用いるモワレ計測
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Author (2)：
BROOKS R E

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, 
HEFLINGER L O

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Material：
Appl Opt  (Applied Optics)

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Volume： 8  Issue： 5  Page： 935-939  Publication year： 1969 
JST Material Number： B0026B  ISSN： 0003-6935  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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光干渉

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Thesaurus term/Semi thesaurus term
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モワレ計測

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Terms in the title (4)：
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光学

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, 
干渉パターン

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, 
モワレ

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, 
計測

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