{{ $t("message.ADVERTISEMENT") }}
{{ $t("message.AD_EXPIRE_DATE") }}{{ad01_expire_date}}
{{ $t("message.ADVERTISEMENT") }}
{{ $t("message.AD_EXPIRE_DATE") }}{{ad02_expire_date}}
Art
J-GLOBAL ID:201602003982661729   Reference number:62A0135271

For alloy transistors proving long term reliability.

アロイ型トランジスタの寿命試験
Author (2):
Material:
Volume: 21  Issue:Page: 102-106  Publication year: 1962
JST Material Number: B0501A  Document type: Article
Article type: 解説  Country of issue: United States (USA) 
Terms in the title (3):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page