Art
J-GLOBAL ID：201602006735483680   Reference number：70A0232946

A new method of measuring dielectric property of very-high-loss materials at high frequencies.

非常に高い損失を示す材料の高周波における誘電体特性を測定する新しい方注
  • Publisher site Copy service
  • Access JDreamⅢ for advanced search and analysis.
Author (2)：
ICHIJO B

About ICHIJO B

, 
ARAI T

About ARAI T


Material：
IEEE Trans Instrum Meas  (IRE Transactions on Instrumentation)

About IEEE Trans Instrum Meas


Volume： 19  Issue： 1  Page： 73-77  Publication year： 1970 
JST Material Number： C0232A  ISSN： 0018-9456  CODEN： IEIMAO  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
誘電体

About 誘電体


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
高誘電損材料用

About 高誘電損材料用

, 
特性測定

About 特性測定

, 
誘電体(特性測定/容量測定回路)

About 誘電体(特性測定/容量測定回路)

, 
容量測定回路

About 容量測定回路

, 
容量測定回路(高誘電損材料用)

About 容量測定回路(高誘電損材料用)


Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
損失

About 損失

, 
高周波

About 高周波

, 
誘電体

About 誘電体


Return to Previous Page

TOP

BOTTOM