Art
J-GLOBAL ID：201602008050669562   Reference number：73A0033819

White-light interferometric thickness gauge.

白色光干渉計による膜厚測定
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Author (3)：
FLOURNOY P A

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, 
McCLURE R W

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, 
WYNTJES G

About WYNTJES G


Material：
Appl Opt  (Applied Optics)

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Volume： 11  Issue： 9  Page： 1907-1915  Publication year： 1972 
JST Material Number： B0026B  ISSN： 0003-6935  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
Michelson干渉計

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, 
屈折率

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, 
白色光

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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
膜厚測定

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Terms in the title (3)：
Terms in the title
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白色

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, 
光干渉計

About 光干渉計

, 
膜厚測定

About 膜厚測定


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