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J-GLOBAL ID：201602015602221371   Reference number：74A0250453

A process for detecting defects in complicated patterns.

複雑パターンの欠陥認識の一手法
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Author (4)：
EJIRI M

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UNO T

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MESE M

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IKEDA S

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Material：
Comput Graph Image Process  (Computer Graphics and Image Processing)

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Volume： 2  Issue： 3/4  Page： 326-339  Publication year： 1973 
JST Material Number： D0172C  ISSN： 0146-664X  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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パターン認識

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欠陥検査

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図形処理

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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
プリント回路

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Terms in the title (2)：
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欠陥

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手法

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