Art
J-GLOBAL ID：201602017106149140   Reference number：73A0026996

Role of cracks, pores, and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics.

透明誘電体表面でのレーザ誘起損傷しきい値へのクラック,細孔および吸収性介在物の役割
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Author (1)：
BLOEMBERGEN N

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Material：
Appl Opt  (Applied Optics)

About Appl Opt


Volume： 12  Issue： 4  Page： 661-664  Publication year： 1973 
JST Material Number： B0026B  ISSN： 0003-6935  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
絶縁破壊

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, 
誘電体

About 誘電体


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ひび割れ

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, 
レーザ損傷

About レーザ損傷

, 
介在物

About 介在物

, 
表面損傷

About 表面損傷


Terms in the title (7)：
Terms in the title
Keywords automatically extracted from the title.
誘電体

About 誘電体

, 
レーザ誘起損傷

About レーザ誘起損傷

, 
しきい値

About しきい値

, 
クラック

About クラック

, 
細孔

About 細孔

, 
介在物

About 介在物

, 
役割

About 役割


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