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J-GLOBAL ID:201602202641318824   Reference number:16A0195998

High-resolution imaging by scanning electron microscopy of semithin sections in correlation with light microscopy

光学顕微鏡法との相関を利用した半薄断面の走査電子顕微鏡法による高分解能イメージング
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Volume: 64  Issue:Page: 387-394  Publication year: Dec. 2015 
JST Material Number: W1384A  ISSN: 2050-5698  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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Microscopy determination of structures  ,  Microscopic methods of living organisms 
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