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J-GLOBAL ID：201602209417061901   Reference number：16A0043752

Qualitative Analysis for Various Types of Small Samples by X-ray Diffractometry

X線回折法による少量サンプルの定性分析
Author (3)：
OKE SHINGO

About OKE SHINGO

(小山工高専)

About 小山工高専

, 
ATSUMI TARO

About ATSUMI TARO

(小山工高専)

About 小山工高専

, 
DEGAWA TSUYOSHI

About DEGAWA TSUYOSHI

(小山工高専)

About 小山工高専


Material：
小山工業高等専門学校研究紀要  (Research Reports of Oyama National College of Technology)

About 小山工業高等専門学校研究紀要


Issue： 48  Page： 129-134  Publication year： Dec. 21, 2015 
JST Material Number： S0863A  ISSN： 0288-2825  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*X-Ray Diffraction

About X-Ray Diffraction

, 
sampling stage

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, 
*microanalysis

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, 
*qualitative analysis

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, 
semiconductor detector

About semiconductor detector

, 
cosmetic

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, 
paste

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, 
liquid

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JST classification (1)：
JST classification
Category name(code) classified by JST.
Other phsical analysis 
(CC03014E)

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Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
X線回折法

About X線回折法

, 
サンプル

About サンプル

, 
定性分析

About 定性分析


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