Art

J-GLOBAL ID：201602215013703624   Reference number：16A0103650

3D measurement using light field microscopy with improved resolution

改良された解像度を持つ光場顕微鏡を用いた3D計測

Author (3)： USUKI Shin (Shizuoka Univ., Hamamatsu, JPN) ,  OHASHI Yuki (Shizuoka Univ., Hamamatsu, JPN) ,  MIURA Kenjiro T. (Shizuoka Univ., Hamamatsu, JPN)
Material： 映像情報メディア学会技術報告
Volume： 39  Issue： 44(IST2015 64-70)  Page： 1-2  Publication year： Nov. 13, 2015 
JST Material Number： S0209A  ISSN： 1342-6893  Document type： Proceedings
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *optical microscope ,  *digital image ,  image processing ,  pixel ,  *3-D measurement ,  evaluation test ,  resolving power ,  radiation field
Semi thesaurus term： サブピクセル処理 ,  picture element ,  光場顕微鏡 ,  光追跡 ,  *three dimensional measurement ,  resolution ,  optical field

JST classification (3)： Optical microscopes,telescopes  (QF05050R) ,  Graphic and image processing in general  (JE04010I) ,  Measuring instruments in general  (AD02000X)

Reference (5)：

• Nayar S K and Nakagawa Y, "Shape from Focus", IEEE Transactions on Pattern Analysis and Machine Intelligence, pp.824-831(1994).
• Bando Y and Nishita T, "Towards Digital Refocusing from a Single Photograph", Pacific Graphics, pp.363-372(2007).
• Levoy M, Ng R, Adams A, Footer M and Horowitz M, "Light Field Microscopy", ACM Transactions on Graphics, pp.924-934(2006).
• Ng R, Levoy M, Brédif M, Duval G, Horowitz M and Hanrahan P, "Light Field Photography with a Hand-held Plenoptic Camera", Stanford Tech Report, (2005).
• Usuki S and Miura K T, "High-resolution Tolerance against Noise Imaging Technique Based on Active Shift of Optical Axis", International Journal Automation Technology, Vol.5 No.2 pp.206-211(2011).

Terms in the title (4)： 解像度 ,  光場 ,  顕微鏡 ,  3D計測