Art

J-GLOBAL ID：201602217950511946   Reference number：16A0187913

Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography

1軸傾斜電子線トモグラフィーと互換性を有する透過型電子顕微鏡用の新しい変形ホルダーの開発

Author (6)： SATO K. (Tohoku Univ., Sendai, JPN) ,  MIYAZAKI H. (Mel-Build Corp., Fukuoka, JPN) ,  GONDO T. (Mel-Build Corp., Fukuoka, JPN) ,  MIYAZAKI S. (FEI Co. Japan Ltd., Tokyo, JPN) ,  MURAYAMA M. (Virginia Tech, VA, USA) ,  HATA S. (Kyushu Univ., Fukuoka, JPN)
Material： Microscopy
Volume： 64  Issue： 5  Page： 369-375  Publication year： Oct. 2015 
JST Material Number： W1384A  ISSN： 2050-5698  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *transmission electron microscope ,  in situ observation ,  *container ,  *tensile test ,  inclination ,  *tomography ,  *sample container
Semi thesaurus term： transmission electron microtomography

JST classification (1)： Microscopy determination of structures  (BK01040E)

Reference (15)：

• Fujita H (1967) Continuous observation of dynamic behaviors of dislocations in aluminum. J. Phys. Soc. Jpn 23: 1349-1361.
• Fujita H (1969) Continuous observation of annealing processes in cold-worked aluminum by high-voltage electron microscopy. J. Phys. Soc. Jpn 26: 1437-1445.
• Pócza J F, Barna A, Barna P B (1969) Formation processes of vacuum-deposited indium films and thermodynamical properties of submicroscopic particles observed by in-situ electron microscopy. J. Vac. Sci. Technol. 6: 472-474.
• Saka H, Imura T (1972) Direct measurement of mobility of edge and screw dislocations in 3% silicon-iron by high voltage transmission electron microscopy. J. Phys. Soc. Jpn 32: 702-716.
• Dehm G, Howe J M, Zweck J (ed.) (2012) In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. (Wiley-VCH Verlag & Co. KGaA, Weinheim, Germany).

Terms in the title (5)： 1軸 ,  電子線トモグラフィー ,  互換性 ,  透過型電子顕微鏡 ,  開発