Art

J-GLOBAL ID：201602224936221261   Reference number：16A0612419

Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing

超高速および高信頼性SOT MRAM:キャッシュ置換ノーマリーオフコンピューティングに向けて【Powered by NICT】

Author (16)： Prenat Guillaume (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Jabeur Kotb (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Vanhauwaert Pierre (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Pendina Gregory Di (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Oboril Fabian (Karlsruhe Institute of Technology (KIT), Kaiserstr. 12,, Karlsruhe, Germany) ,  Bishnoi Rajendra (Karlsruhe Institute of Technology (KIT), Kaiserstr. 12,, Karlsruhe, Germany) ,  Ebrahimi Mojtaba (Karlsruhe Institute of Technology (KIT), Kaiserstr. 12,, Karlsruhe, Germany) ,  Lamard Nathalie (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Boulle Olivier (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Garello Kevin (Department of Materials, ETH Zuerich, Honggerbergring 64, Zuerich, Switzerland) ,  Langer Juergen (Singulus Technologies, Kahl, Germany) ,  Ocker Berthold (Singulus Technologies, Kahl, Germany) ,  Cyrille Marie-Claire (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France) ,  Gambardella Pietro (Department of Materials, ETH Zuerich, Honggerbergring 64, Zuerich, Switzerland) ,  Tahoori Mehdi (Karlsruhe Institute of Technology (KIT), Kaiserstr. 12,, Karlsruhe, Germany) ,  Gaudin Gilles (, Univ. Grenoble Alpes, INAC-SPINTEC, F-38000 Grenoble, France; CNRS, INAC-SPINTEC, F-38000 Grenoble, France; and CEA, INAC-SPINTEC, F-38000 Grenoble, France)
Material： IEEE Transactions on Multi-Scale Computing Systems
Volume： 2  Issue： 1  Page： 49-60  Publication year： 2016 
JST Material Number： W2447A  ISSN： 2332-7766  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： This paper deals with a new MR...

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Thesaurus term： electric power consumption ,  durability ,  memory hierarchy ,  torque ,  penalty ,  *reliability(property) ,  *cache memory ,  complementary metal oxide semiconductor
Semi thesaurus term： スピントルク ,  *高信頼性 ,  *超高速 , 【Automatic Indexing@JST】

JST classification (1)： Pattern recognition  (JE07000S)

Terms in the title (4)： 高信頼性 ,  MRAM ,  キャッシュ ,  置換