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J-GLOBAL ID：201602258734666815   Reference number：16A0471825

Precise measurement of single carbon nanocoils using focused ion beam technique

集束イオンビーム法による単一カーボンナノコイルの精密測定

Author (7)： Nakamura Yasushi (Dep. of Electrical and Electronic Information Engineering, Toyohashi Univ. of Technol., Toyohashi, Aichi 441-8580, Japan) ,  Suda Yoshiyuki (Dep. of Electrical and Electronic Information Engineering, Toyohashi Univ. of Technol., Toyohashi, Aichi 441-8580, Japan) ,  Kunimoto Ryuji (Dep. of Electrical and Electronic Information Engineering, Toyohashi Univ. of Technol., Toyohashi, Aichi 441-8580, Japan) ,  Iida Tamio (Dep. of Electrical and Computer Engineering, National Inst. of Technol., Gifu Coll., Motosu, Gifu 501-0495, Japan) ,  Takikawa Hirofumi (Dep. of Electrical and Electronic Information Engineering, Toyohashi Univ. of Technol., Toyohashi, Aichi 441-8580, Japan) ,  Ue Hitoshi (Fuji Res. Lab., Tokai Carbon Co., Ltd., Oyama, Shizuoka 410-1431, Japan) ,  Shima Hiroyuki (Dep. of Environmental Sci.s, Univ. of Yamanashi, Kofu, Yamanashi 400-8510, Japan)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 108  Issue： 15  Page： 153108-153108-4  Publication year： Apr. 11, 2016 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： We have developed a precise re...

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Thesaurus term： *focused ion beam ,  *nanomaterial ,  *carbon fiber ,  *precision measurement ,  *electrical resistivity ,  transmission electron microscope ,  carbon nanocoil
Semi thesaurus term： TEM (microscope) ,  resistivity

JST classification (2)： Carbon and its compounds  (YB02060D) ,  LCR parts  (NA05030D)

Terms in the title (3)： 集束イオンビーム法 ,  カーボンナノコイル ,  精密測定