Art

J-GLOBAL ID：201602272481808045   Reference number：16A1321228

Perfect Composition Depth Profiling of Ionic Liquid Surfaces Using High-resolution RBS/ERDA

高分解能RBS/ERDAを用いるイオン液体表面の完全組成深さプロファイリング

Author (6)： NAKAJIMA Kaoru (Department of Micro Engineering, Kyoto University) ,  ZOLBOO Enkhbayar (Department of Micro Engineering, Kyoto University) ,  OHASHI Tomohiro (Department of Micro Engineering, Kyoto University) ,  LISAL Martin (Laboratory of Aerosols Chemistry and Physics, Institute of Chemical Process Fundamentals of the CAS) ,  LISAL Martin (Department of Physics, Faculty of Science, J. E. Purkinje University) ,  KIMURA Kenji (Department of Micro Engineering, Kyoto University)
Material： Analytical Sciences  (Anal Sci)
Volume： 32  Issue： 10  Page： 1089-1094(J-STAGE)  Publication year： 2016 
JST Material Number： G0673B  ISSN： 0910-6340  CODEN： ANSCEN  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *ionic liquid ,  *depth profile ,  Rutherford back scattering ,  *Rutherford scattering spectroscopy ,  computer simulation ,  *radiation absorption analysis ,  *surface structure ,  preferred orientation
Semi thesaurus term： *elastic recoil detection analysis ,  Molecular Dynamics Simulation

Author keywords (5)： Surface structure ,  ionic liquid ,  hydrogen ,  ERDA ,  RBS

JST classification (2)： Molten salts  (CB05050R) ,  Radiochemical analysis of organic compounds  (CC06034V)

Substance index (3)： 1-Ethyl-3-methyl-1H-imidazole-3-ium・bis(trifluoromethylsulfonyl)amineanion ,  [C₆Mim][NTf₂ ,  [C₁₀mim][Tf₂N]

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Terms in the title (4)： 高分解能 ,  イオン液体 ,  組成 ,  深さプロファイリング