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J-GLOBAL ID：201702210791912525   Reference number：17A0158587

Research on Electron Irradiation Test of Si-PIN Detectors for Space Particle Monitor

空間粒子検出に用いるSI-PINセンサの電子照射試験【JST・京大機械翻訳】

Author (8)： Sun Ying (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Wang Feng (Unit 61741 of PLA) ,  Zhang Shenyi (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Jing Tao (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Yang Chuibai (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Shen Guohong (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Zhang Huanxin (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences) ,  Yan Xuemei (Beijing Key Laboratory of Space Environment Exploration, National Space Science Center, Chinese Academy of Sciences)
Material： Kongjian Kexue Xuebao  (Chinese Journal of Space Science)
Volume： 36  Issue： 6  Page： 932-937  Publication year： 2016 
JST Material Number： C2063A  ISSN： 0254-6124  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： Long term high energy electron...

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Thesaurus term： exposure radiation dose ,  signal reception ,  *sensor ,  leakage current ,  radiation dose ,  *electron irradiation ,  noise figure ,  semiconductor ,  counting ,  detectability ,  high energy electron

Author keywords (4)： High energy electron ,  Semiconductor detector ,  Irradiation ,  Noise

JST classification (4)： Radiation polymer chemistry  (CG03050S) ,  Irradiational changes of other materials  (BK16124V) ,  Irradiational changes semiconductors  (BK16123E) ,  Secondary batteries  (YB04030K)

Terms in the title (3)： 粒子検出 ,  電子照射 ,  試験