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Art
J-GLOBAL ID:201702217471366966   Reference number:17A0443950

Random fractal surface analysis of disordered organic thin films

無秩序化した有機薄膜のランダムフラクタル表面分析【Powered by NICT】
Author (4):
Material:
Volume: 623  Page: 147-156  Publication year: 2017
JST Material Number: B0899A  ISSN: 0040-6090  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
Abstract/Point:
Abstract/Point
Japanese summary of the article(about several hundred characters).
All summary is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
Study of surface morphologies ...
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Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
, 【Automatic Indexing@JST】
JST classification (2):
JST classification
Category name(code) classified by JST.
Semiconductor thin films  ,  Oxide thin films 
Terms in the title (4):
Terms in the title
Keywords automatically extracted from the title.

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