Art

J-GLOBAL ID：201702220363782215   Reference number：17A1036805

Key note: Integrated design-for-reliability for ICs

キーノート:ICのための統合設計のための信頼性【Powered by NICT】

Author (6)： Wang Albert (Dept. of ECE, University of California, Riverside, CA, USA) ,  Lu Fei (Dept. of ECE, University of California, Riverside, CA, USA) ,  Chen Qi (Dept. of ECE, University of California, Riverside, CA, USA) ,  Wang Chenkun (Dept. of ECE, University of California, Riverside, CA, USA) ,  Li Cheng (Dept. of ECE, University of California, Riverside, CA, USA) ,  Zhang Feilong (Dept. of ECE, University of California, Riverside, CA, USA)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2017  Issue： LASCAS  Page： 1-4  Publication year： 2017 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： This paper reviews historical ...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=17A1036805&from=J-GLOBAL&jstjournalNo=W2441A") }}

Thesaurus term： failure ,  *reliability(property)
Semi thesaurus term： ESD保護 ,  静電気放電 ,  オンチップ , 【Automatic Indexing@JST】

JST classification (1)： Semiconductor integrated circuit  (NC03162T)

Terms in the title (2)： IC ,  統合設計