Art

J-GLOBAL ID：201702229840065865   Reference number：17A0009413

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

1から10nmまでの軟X線スペクトル領域における高度荷電イオンプラズマ放射のためのフラットフィールドすれすれ入射分光計の評価

Author (17)： Dinh Thanh Hung (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Kondo Yoshiki (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Tamura Toshiki (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Ono Yuichi (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Hara Hiroyuki (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Oikawa Hiroki (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan) ,  Yamamoto Yoichi (Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan) ,  Ishino Masahiko (Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan) ,  Nishikino Masaharu (Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan) ,  Makimura Tetsuya (Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan) ,  Dunne Padraig (School of Physics, University College Dublin, Belfield, Dublin 4, Ireland) ,  O'Sullivan Gerry (School of Physics, University College Dublin, Belfield, Dublin 4, Ireland) ,  Ohta Shigeru (Vacuum and Optical Instruments, 2-18-18 Shimomaruko, Ohta-ku, Tokyo 146-0092, Japan) ,  Kitano Ken (Vacuum and Optical Instruments, 2-18-18 Shimomaruko, Ohta-ku, Tokyo 146-0092, Japan) ,  Ejima Takeo (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan) ,  Hatano Tadashi (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan) ,  Higashiguchi Takeshi (Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan)
Material： Review of Scientific Instruments  (Rev Sci Instrum)
Volume： 87  Issue： 12  Page： 123106-123106-7  Publication year： Dec. 2016 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *X-ray spectrometer ,  soft X-ray ,  multiply charged ion ,  *plasma spectroscopy ,  X-ray diffraction ,  grazing incidence ,  diffraction grating ,  CCD camera ,  calibration

JST classification (1)： Plasma diagnostics  (BJ02090L)

Terms in the title (10)： 軟X線 ,  スペクトル ,  荷電 ,  イオン ,  プラズマ放射 ,  フラット ,  フィールド ,  すれすれ入射 ,  分光計 ,  評価