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J-GLOBAL ID：201702235485417249   Reference number：17A0214170

High-yield large area MoS₂ technology: Material, device and circuits co-optimization

高収率大面積MoS_2技術:材料,デバイスと回路の同時最適化【Powered by NICT】

Author (13)： Yu L. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  El-Damak D. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Radhakrishna U. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Zubair A. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Piedra D. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Ling X. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Lin Y. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Zhang Y. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Lee Y.-H. (National Tsing-Hua University, Hsinchu, Taiwan) ,  Antoniadis D. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Kong J. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Chandrakasan A. (Massachusetts Institute of Technology, Cambridge, MA, USA) ,  Palacios T. (Massachusetts Institute of Technology, Cambridge, MA, USA)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2016  Issue： IEDM  Page： 5.7.1-5.7.4  Publication year： 2016 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Two-dimensional electronics ba...

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Thesaurus term： *Electronics ,  monolayer ,  crystal structure ,  two dimension ,  NAND ,  *concurrent optimization ,  *large area
Semi thesaurus term： テストチップ ,  論理ゲート ,  設計フロー ,  輸送特性 , 【Automatic Indexing@JST】

JST classification (2)： Secondary batteries  (YB04030K) ,  Carbon and its compounds  (YB02060D)

Terms in the title (3)： 収率 ,  大面積 ,  同時最適化