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J-GLOBAL ID：201702236877224151   Reference number：17A0205197

A new method for specular curved surface defect inspectionbased on reflected pattern integrity

パターン完全性に基づく高反射表面欠陥検出の新しい方法【JST・京大機械翻訳】

Author (4)： Jiang Meihua (School of Precision Instrument and OptoElectronics Engineering,Tianjin University) ,  Fu Luhua (School of Precision Instrument and OptoElectronics Engineering,Tianjin University) ,  Wang Zhong (School of Precision Instrument and OptoElectronics Engineering,Tianjin University) ,  Song Yuhang (School of Precision Instrument and OptoElectronics Engineering,Tianjin University)
Material： Ceshi Kexue Yu Yiqi
Volume： 7  Issue： 3  Page： 221-228  Publication year： 2016 
JST Material Number： C2843A  ISSN： 1674-8042  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： ENGLISH (EN)

Abstract/Point： Defect inspection of specular ...

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Thesaurus term： image processing ,  torsion (phenomenon) ,  *fault detection ,  image ,  spherical surface ,  *surface defect ,  higher harmonic ,  light source ,  *completeness ,  concentric circle ,  specularity ,  steel ball

Author keywords (5)： specularity ,  curved surface ,  defect inspection ,  reflected pattern ,  computer vision

JST classification (2)： Nondestructive testing  (HB02030F) ,  Graphic and image processing in general  (JE04010I)

Terms in the title (2)： 完全性 ,  表面欠陥