Art
J-GLOBAL ID：201702242768990826
Reference number：17A0901591
性能カウンタを用いた近似実行の高速なエミュレーション
Author (2)：
,
Material：
Volume：
2017
Issue：
OS-141
Page：
Vol.2017-OS-141,No.12,1-9 (WEB ONLY)
Publication year：
Jul. 19, 2017
JST Material Number：
U0451A
Document type：
Proceedings
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,
,
,
,
,
,
,
,
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,
,
,
JST classification (4)：
JST classification
Category name(code) classified by JST.
Operating systems
, Computer networks
, Digital computer systems in general
, Memory units
Reference (18)：
-
Akiyama, S. and Hirofuchi, T.: Quantitative Evaluation of Intel PEBS Overhead for Online System-Noise Analysis, International Workshop on Runtime and Operating Systems for Supercomputers (ROSS), pp. 1-8 (2017).
-
Carbin, M., Misailovic, S. and Rinard, M. C.: Verifying Quantitative Reliability for Programs That Execute on Unreliable Hardware, International Conference on Object Oriented Programming Systems Languages & Applications (OOPSLA), pp. 33-52 (2013).
-
Chang, K. K., Kashyap, A., Hassan, H., Ghose, S., Hsieh, K., Lee, D., Li, T., Pekhimenko, G., Khan, S. and Mutlu, O.: Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization, International Conference on Measurement and Modeling of Computer Science (SIGMETRICS), pp. 323-336 (2016).
-
Chen, D., Ye, C. and Ding, C.: Write Locality and Optimization for Persistent Memory, International Symposium on Memory Systems (MEMSYS), pp. 77-87 (2016).
-
ELPIDA: Low Power Function of Mobile RAM - Partial Array Self Refresh (PASR), (online), available from <https://www.micron.com/~/media/documents/products/technical-note/dram/e0597e10.pdf> (2005).
ｍore...
Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
,
,
Return to Previous Page
