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J-GLOBAL ID:201702250556330172   Reference number:17A1761649

A two-sample test for high-dimension, low-sample-size data under the strongly spiked eigenvalue model

強くスパイクされた固有値モデルの下の高次,低サンプルサイズのデータに対する2サンプルテスト
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Material:
Volume: 47  Issue:Page: 273-288  Publication year: Nov. 2017 
JST Material Number: S0562B  ISSN: 0018-2079  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Analysis  ,  Molecular and genetic information processing 

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