Art

J-GLOBAL ID：201702253282509344   Reference number：17A0302747

Design of two-dimensional screen fragment kinetic energy measurement system

二次元スクリーンの運動エネルギー試験システム設計【JST・京大機械翻訳】

Author (4)： Zhang Huwei (National Key Laboratory for Electronic Measurement Technology,North University of China, Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education) ,  Li Jinming (National Key Laboratory for Electronic Measurement Technology,North University of China, Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education) ,  Gao Wen'gang (National Key Laboratory for Electronic Measurement Technology,North University of China, Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education) ,  Guo Chun (National Key Laboratory for Electronic Measurement Technology,North University of China, Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education)
Material： Zhongguo Ceshi
Volume： 42  Issue： 8  Page： 93-97  Publication year： 2016 
JST Material Number： C3059A  ISSN： 1674-5124  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： Aiming at the difficulties of ...

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Thesaurus term： symmetry ,  *system design ,  universal serial bus ,  electromagnetic compatibility (interference) ,  *two dimension ,  asymmetry ,  flash memory ,  *screen ,  high speed ,  one dimension ,  FPGA ,  *kinetic energy ,  high accuracy ,  light intensity ,  NAND flash memory ,  *energy ,  *mechanical quantity
Semi thesaurus term： NANDフラッシュ , 【Automatic Indexing@JST】

Author keywords (4)： fragment kinetic ,  two-dimensional screen ,  FPGA ,  non-rotational symmetry

JST classification (2)： Computer networks  (JC03000K) ,  Graphic and image processing in general  (JE04010I)

Terms in the title (4)： スクリーン ,  運動エネルギー ,  試験システム ,  設計