Art
J-GLOBAL ID：201702258143689784   Reference number：17A1027369

Test-set reordering for improving diagnosability

診断可能性を改善するための試験セット再秩序化【Powered by NICT】
Author (2)：
Xue Cheng

About Xue Cheng

(ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA)

About ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA

, 
Blanton R.D.

About Blanton R.D.

(ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA)

About ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA


Material：
IEEE Conference Proceedings  (IEEE Conf Proc)

About IEEE Conference Proceedings


Volume： 2017  Issue： VTS  Page： 1-6  Publication year： 2017 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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Precise and accurate logic dia...
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mass production

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, 
integrated circuit

About integrated circuit

, 
*rapid analysis

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, 
resolving power

About resolving power

, 
high speed

About high speed


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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データ量

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, 【Automatic Indexing@JST】
JST classification (2)：
JST classification
Category name(code) classified by JST.
Semiconductor integrated circuit 
(NC03162T)

About Semiconductor integrated circuit

,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
診断

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, 
可能性

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, 
試験

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, 
秩序化

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