Art

J-GLOBAL ID：201702267261134390   Reference number：17A0417535

11.1 A 512Gb 3b/cell flash memory on 64-word-line-layer BiCS technology

LXIVワード線層BiCS技術に関する11.1 512Gb3b/セルのフラッシュメモリ【Powered by NICT】

Author (57)： Yamashita Ryuji (Western Digital, Milpitas, CA, United States of America) ,  Magia Sagar (Western Digital, Milpitas, CA, United States of America) ,  Higuchi Tsutomu (Toshiba, Yokohama, Japan) ,  Yoneya Kazuhide (Toshiba, Yokohama, Japan) ,  Yamamura Toshio (Toshiba, Yokohama, Japan) ,  Mizukoshi Hiroyuki (Western Digital, Milpitas, CA, United States of America) ,  Zaitsu Shingo (Western Digital, Milpitas, CA, United States of America) ,  Yamashita Minoru (Western Digital, Milpitas, CA, United States of America) ,  Toyama Shunichi (Western Digital, Milpitas, CA, United States of America) ,  Kamae Norihiro (Western Digital, Milpitas, CA, United States of America) ,  Lee Juan (Western Digital, Milpitas, CA, United States of America) ,  Chen Shuo (Western Digital, Milpitas, CA, United States of America) ,  Tao Jiawei (Western Digital, Milpitas, CA, United States of America) ,  Mak William (Western Digital, Milpitas, CA, United States of America) ,  Zhang Xiaohua (Western Digital, Milpitas, CA, United States of America) ,  Yu Ying (Western Digital, Milpitas, CA, United States of America) ,  Utsunomiya Yuko (Toshiba, Yokohama, Japan) ,  Kato Yosuke (Western Digital, Milpitas, CA, United States of America) ,  Sakai Manabu (Western Digital, Milpitas, CA, United States of America) ,  Matsumoto Masahide (Western Digital, Milpitas, CA, United States of America) ,  Chibvongodze Hardwell (Western Digital, Milpitas, CA, United States of America) ,  Ookuma Naoki (Western Digital, Milpitas, CA, United States of America) ,  Yabe Hiroki (Western Digital, Milpitas, CA, United States of America) ,  Taigor Subodh (Western Digital, Milpitas, CA, United States of America) ,  Samineni Rangarao (Western Digital, Milpitas, CA, United States of America) ,  Kodama Takuyo (Toshiba, Yokohama, Japan) ,  Kamata Yoshihiko (Toshiba, Yokohama, Japan) ,  Namai Yuzuru (Toshiba, Yokohama, Japan) ,  Huynh Jonathan (Western Digital, Milpitas, CA, United States of America) ,  Wang Sung-En (Western Digital, Milpitas, CA, United States of America) ,  He Yankang (Western Digital, Milpitas, CA, United States of America) ,  Pham Trung (Western Digital, Milpitas, CA, United States of America) ,  Saraf Vivek (Western Digital, Milpitas, CA, United States of America) ,  Petkar Akshay (Western Digital, Milpitas, CA, United States of America) ,  Watanabe Mitsuyuki (Western Digital, Milpitas, CA, United States of America) ,  Hayashi Koichiro (Western Digital, Milpitas, CA, United States of America) ,  Swarnkar Prashant (Western Digital, Milpitas, CA, United States of America) ,  Miwa Hitoshi (Western Digital, Milpitas, CA, United States of America) ,  Pradhan Aditya (Western Digital, Milpitas, CA, United States of America) ,  Dey Sulagna (Western Digital, Milpitas, CA, United States of America) ,  Dwibedy Debasish (Western Digital, Milpitas, CA, United States of America) ,  Xavier Thushara (Western Digital, Milpitas, CA, United States of America) ,  Balaga Muralikrishna (Western Digital, Milpitas, CA, United States of America) ,  Agarwal Samiksha (Western Digital, Milpitas, CA, United States of America) ,  Kulkarni Swaroop (Western Digital, Milpitas, CA, United States of America) ,  Papasaheb Zameer (Western Digital, Milpitas, CA, United States of America) ,  Deora Sahil (Western Digital, Milpitas, CA, United States of America) ,  Hong Patrick (Western Digital, Milpitas, CA, United States of America) ,  Wei Meiling (Western Digital, Milpitas, CA, United States of America) ,  Balakrishnan Gopinath (Western Digital, Milpitas, CA, United States of America) ,  Ariki Takuya (Western Digital, Milpitas, CA, United States of America) ,  Verma Kapil (Western Digital, Milpitas, CA, United States of America) ,  Siau Chang (Western Digital, Milpitas, CA, United States of America) ,  Dong Yingda (Western Digital, Milpitas, CA, United States of America) ,  Lu Ching-Huang (Western Digital, Milpitas, CA, United States of America) ,  Miwa Toru (Western Digital, Milpitas, CA, United States of America) ,  Moogat Farookh (Western Digital, Milpitas, CA, United States of America)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2017  Issue： ISSCC  Page： 196-197  Publication year： 2017 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： High floating-gate (FG) to FG ...

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Thesaurus term： durability ,  floating gate ,  reliability(property) ,  odd number ,  *flash memory ,  charge(battery) ,  multilayer film ,  decoding ,  lithography ,  throughput ,  three dimension
Semi thesaurus term： 読出し ,  高密度 ,  NAND ,  *ワード線 , 【Automatic Indexing@JST】

JST classification (1)： Semiconductor integrated circuit  (NC03162T)

Terms in the title (4)： ワード線 ,  BiCS技術 ,  セル ,  フラッシュメモリ