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J-GLOBAL ID：201702281698825257   Reference number：17A1956521

A Device for Ribbon Collection for Array Tomography with Scanning Electron Microscopy

走査型電子顕微鏡を用いたアレイトモグラフィーのためのリボン回収装置

Author (9)： Koike Taro (Department of Anatomy and Cell Science, Kansai Medical University) ,  Kataoka Yosky (Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center) ,  Kataoka Yosky (Cellular Function Imaging Team, Division of Bio-function Dynamics Imaging, RIKEN Center for Life Science Technologies) ,  Maeda Mitsuyo (Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center) ,  Hasebe Yuji (Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center) ,  Yamaguchi Yuuki (Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center) ,  Suga Mitsuo (Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center) ,  Saito Akira (Institute of Biomedical Science Central Research Center, Kansai Medical University) ,  Yamada Hisao (Department of Anatomy and Cell Science, Kansai Medical University)
Material： Acta Histochemica et Cytochemica (Web)  (Acta Histochem Cytochem (Web))
Volume： 50  Issue： 5  Page： 135-140(J-STAGE)  Publication year： 2017 
JST Material Number： U0129A  ISSN： 1347-5800  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *scanning electron microscope ,...
Semi thesaurus term： *アレイトモグラフィー ,...

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Author keywords (5)： array tomography ,  three-dimensional observation ,  serial ultrathin section ,  post-embedding labeling ,  scanning electron microscopy

JST classification (1)： Microscopic methods of living organisms  (EA03050C)

Reference (12)：

• 1 Briggman, K. L. and Bock, D. D. (2012) Volume electron microscopy for neuronal circuit reconstruction. Curr. Opin. Neurobiol. 22; 154-161.
• 2 Denk, W. and Horstmann, H. (2004) Serial block-face scanning electron microscopy to reconstruct three-dimensional tissue nanostructure. PLoS Biol. 2; e329.
• 3 Hayworth, K. J., Morgan, J. L., Schalek, R., Berger, D. R., Hildebrand, D. G. and Lichtman, J. W. (2014) Imaging ATUM ultrathin section libraries with Wafer Mapper: a multi-scale approach to EM reconstruction of neural circuits. Front. Neural Circuits 8; 68.
• 4 Horstmann, H., Körber, C., Sätzler, K., Aydin, D. and Kuner, T. (2012) Serial section scanning electron microscopy (S³EM) on silicon wafers for ultra-structural volume imaging of cells and tissues. PLoS One 7; e35172.
• 5 Knott, G., Marchman, H., Wall, D. and Lich, B. (2008) Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling. J. Neurosci. 28; 2959-2964.

Terms in the title (5)： 走査型電子顕微鏡 ,  アレイ ,  トモグラフィー ,  リボン ,  回収装置