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J-GLOBAL ID:201702282319676777   Reference number:17A0211401

軟X線分光法を利用したin-situ/operando分析の進展

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Volume: 59  Issue: 12  Page: 333-340(J-STAGE)  Publication year: 2016 
JST Material Number: G0194A  ISSN: 1882-2398  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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X-ray instruments and techniques 
Reference (58):
  • 1) W. Gudat and C. Kunz: Phys. Rev. Lett., 29 (1972) 169.
  • 2) J. Stöhr: NEXAFS Spectroscopy (Springer, Berlin, 1992).
  • 3) B. X. Yang and J. Kirz: Phys. Rev. B, 36 (1987) 1361.
  • 4) M. D. Roper, G. van der Laan, J. V. Flaherty and H. A. Padmore: Rev. Sci. Instrum., 63 (1992) 1482.
  • 5) A. Kivimaki, K. Maier, U. Hergenhahn, M. N. Piancastelli, B. Kempgens, A. Rudel and A. M. Bradshaw: Phys. Rev. Lett., 81 (1998) 301.
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