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J-GLOBAL ID:201702288011678851   Reference number:17A0503811

低出力X線管を利用したX線吸収分光

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Issue:Page: 150-151  Publication year: Apr. 05, 2017 
JST Material Number: S0128B  ISSN: 0386-2178  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Analytical instruments  ,  Other methods of structure determination 
Reference (15):
  • H. Hanson, W. W. Beeman : Phys. Rev., 76, 118 (1949).
  • D. C. Koningsberger : “X-ray absorption: principles, applications, techniques of EXAFS, SEXAFS, and XANES”, eds. D. C. Koningsberger, R. Prins, pp. 163-210, (1988) John Wiley and Sons, New York
  • 宇田川康夫,田路和幸:“X線吸収微細構造-XAFSの測定と解析”,宇田川康夫編,pp.110-126,(1993),学会出版センター.
  • Z. Németh, J. Szlachetko, É. G. Bajnóczi, G. Vankó : Rev. Sci. Instrum., 87, 103105 (2016).
  • G. T. Seidler, D. R. Mortensen, A. S. Ditter, A. J. Remesnik :J. Phys.. Conf. Ser., 712, 012015 (2016).
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