Art

J-GLOBAL ID：201702291988612613   Reference number：17A0685021

A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory science

ビームラインと実験室科学用の実用的超伝導微量熱量計X線スペクトロメータ

Author (26)： Doriese W. B. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Abbamonte P. (Department of Physics, University of Illinois, Urbana, Illinois 61801, USA) ,  Alpert B. K. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Bennett D. A. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Denison E. V. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Fang Y. (Department of Physics, University of Illinois, Urbana, Illinois 61801, USA) ,  Fischer D. A. (National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA) ,  Fitzgerald C. P. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Fowler J. W. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Gard J. D. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Hays-Wehle J. P. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Hilton G. C. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Jaye C. (National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA) ,  McChesney J. L. (Argonne National Laboratory, Advanced Photon Source, Argonne, Illinois 60439, USA) ,  Miaja-Avila L. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Morgan K. M. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Joe Y. I. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  O'Neil G. C. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Reintsema C. D. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Rodolakis F. (Argonne National Laboratory, Advanced Photon Source, Argonne, Illinois 60439, USA) ,  Schmidt D. R. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Tatsuno H. (Department of Chemical Physics, Lund University, Lund, Sweden) ,  Uhlig J. (Department of Chemical Physics, Lund University, Lund, Sweden) ,  Vale L. R. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Ullom J. N. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA) ,  Swetz D. S. (National Institute of Standards and Technology, Boulder, Colorado 80305, USA)
Material： Review of Scientific Instruments  (Rev Sci Instrum)
Volume： 88  Issue： 5  Page： 053108-053108-23  Publication year： May. 2017 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *microcalorimeter ,  *sensor ,  phase transition ,  *X-ray spectrometer ,  energy dissipation ,  superconducting thin film ,  *transition edge sensor
Semi thesaurus term： energy dissipation ,  *superconducting transition edge sensor

JST classification (1)： Radiation spectroscopy and spectrometers  (AD08030U)

Terms in the title (6)： ビームライン ,  実験室 ,  科学 ,  超伝導 ,  微量熱量計 ,  X線スペクトロメータ