J-GLOBAL ID:201801015693646753   Update date: Feb. 06, 2024


Homepage URL  (1): https://samurai.nims.go.jp/profiles/DA_Bo?locale=en
Research field  (1): Thin-film surfaces and interfaces
Papers (54):
  • Bo Da, Long Cheng, Xun Liu, Kunji Shigeto, Kazuhito Tsukagoshi, Toshihide Nabatame, Zejun Ding, Yang Sun, Jin Hu, Jiangwei Liu, et al. Cylindrically symmetric rotating crystals observed in crystallization process of InSiO film. Science and Technology of Advanced Materials: Methods. 2023. 3. 1
  • Jiangwei Liu, Tokuyuki Teraji, Bo Da, Yasuo Koide. Electrical Properties of Boron-Doped Diamond MOSFETs With Ozone as Oxygen Precursor for Al<inline-formula> <tex-math notation="LaTeX">$_{\text{2 } }$</tex-math> </inline-formula>O<inline-formula> <tex-math notation="LaTeX">$_{\text{3 } }$</tex-math> </inline-formula> Deposition. IEEE Transactions on Electron Devices. 2023
  • Ovidiu Cretu, Dai-Ming Tang, Da-Bao Lu, Bo Da, Yoshihiro Nemoto, Naoyuki Kawamoto, Masanori Mitome, Zejun Ding, Koji Kimoto. Nanometer-level temperature mapping of Joule-heated carbon nanotubes by plasmon spectroscopy. Carbon. 2023. 201. 1025-1029
  • B. Da, X. Liu, J. M. Gong, Z. H. Zhang, Z. J. Ding, N. T. Cuong, J. Hu, J. W. Liu, Z. S. Gao, H. X. Guo, et al. Emitted secondary Electrons: In vacuo plasmon energy gain observation using a Three-Point probe method. Applied Surface Science. 2022. 596
  • B. Da, X. Liu, L. H. Yang, J. M. Gong, Z. J. Ding, H. Shinotsuka, J. W. Liu, H. Yoshikawa, S. Tanuma. Evaluation of dielectric function models for calculation of electron inelastic mean free path. Journal of Applied Physics. 2022
MISC (2):
  • Z. J. Ding, Chao Li, Bo Da, Jiangwei Liu. Charging effect induced by electron beam irradiation: a review. Science and Technology of Advanced Materials. 2021. 22. 1. 932-971
  • Bo Da, Shifeng Mao, ZheJun Ding. Negative Probability Sampling in Study of Reflection Surface Electron Spectroscopy Spectrum. 2015
Lectures and oral presentations  (1):
  • Low energy electron-electron interaction information of graphene measured from secondary electron microscopy
    (7th International Symposium on Practical Surface Analysis 2016)
Awards (1):
  • 2017/04 - National Institute for Materials Science National Institute for Materials Science President’s Prize for Advances in Science and Technology for Young Scientists
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

Return to Previous Page