Rchr
J-GLOBAL ID:201801019605011226   Update date: Jul. 06, 2024

Hoshino Tetsuya

Hoshino Tetsuya
Homepage URL  (1): http://phosi.web.fc2.com/index.html
Research field  (1): Applied physics - general
Research keywords  (8): neuron ,  X-ray ,  Rigorous Coupled-Wave Analysis ,  光波散乱計測 ,  optical measurement ,  resonance domain ,  scatterometry ,  optics
Papers (34):
  • Tetsuya Hoshino, Sadao Aoki, Masahide Itoh, Hiroshi Itoh, Takato Inoue, Satoshi Matsuyama. Examination of measurement by hard X-ray grazing incidence diffraction patterns of isolated lattices for 3D 1-nm resolution. Optical Engineering. 2024. 63. 11
  • Tetsuya Hoshino, Sadao Aoki, Masahide Itoh, Hiroshi Itoh. Rigorous 3D analysis of isolated resist pattern using soft X-ray spectrum. OPTICS and PHOTONICS International Congress(OPIC 2023) XOPT2023. 2023. p-13
  • Tetsuya Hoshino, Shintaro Narioka, Sadao Aoki, Masahide Itoh, Masami Kobayashi. Scatterometry using deep learning for analysis of oil including phosphor. The 15th Pacific Rim Conference on Lasers and Electro-Optics (CLEO-PR 2022). 2022. CFP6J-04
  • Tetsuya Hoshino, Masahiko Shiono, Saswatee Banerjee, Sadao Aoki, Kenji Sakurai, Masahide Itoh. Assessment of High Accuracy 3D Shape Analysis. Research Developments in Science and Technology. 2022. 5. 17. 100-113
  • Tetsuya Hoshino, Sadao Aoki, Masahide Itoh, Motoharu Shichiri, Hiroshi Itoh. Scatterometry of isolated resist pattern by soft X-rays using deep-learning analysis. Optics InfoBase Conference Papers. 2022
more...
MISC (30):
  • New developments in scatterometry of isolated systems. Proceedings of the 49th Optical Symposium (Japan). 2024. 5-8
  • 星野 鉄哉, 青木 貞雄, 伊藤 雅英, 岩田 卓, 武井 陽介. 細胞の3次元断面構造の深層学習による高確度・高速計測. Optics & Photonics Japan 2023 講演予稿集. 2023. 27pP9
  • Rigorous calculation of hard X-ray grazing incidence diffraction patterns for isolated lattices. 2023. 27pP10
  • 岩田卓, 星野鉄哉, 根東覚, 佐々木哲也, 武井陽介, 伊藤雅英. 光波散乱計測を用いた分散培養ニューロンの3次元形態解析システム. 日本解剖学会総会・全国学術集会抄録集(CD-ROM). 2023. 128th
  • 星野鉄哉, 青木貞雄, 伊藤雅英, 井藤浩志. Rigorous 3D cross-sectional profiling using wavelength dependence of soft x-ray diffraction. KEK Progress Report (Web). 2023. 2023-2
more...
Patents (10):
Professional career (1):
  • 工学博士 (筑波大学)
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