Rchr
J-GLOBAL ID：201801020542447698
Update date: Feb. 06, 2024
Kuribara Kazunori
クリバラ カズノリ | Kuribara Kazunori
Affiliation and department：
Research field (1)：
Electronic devices and equipment
Research theme for competitive and other funds (3)：
- 2022 - 2025 Transistor Array Measurements for Physical Unclonable Function with Flexible Printable Transistors
- 2020 - 2023 有機-シリコン混成回路による高機能・超低価格使い捨てヘルスケアセンサの実現
- 2020 - 2023 弾性体/塑性材料構造の湾曲を用いた平面電子デバイスを糸状に変形させる基盤技術
Papers (40)：
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Kunihiro Oshima, Kazunori Kuribara, Takashi Sato. Layout Design for DNTT-based Organic TFTs Considering Fringe Leakage Current. IEEE Journal on Flexible Electronics. 2024
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Kazunori Kuribara, Atsushi Takei, Takashi Sato, MANABU YOSHIDA. Low voltage operation of organic thin-film transistor with atmospheric coating of high-k polymer dielectric. Japanese Journal of Applied Physics. 2023
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Kunihiro Oshima, Kazunori Kuribara, Takashi Sato. Flex-SNN: Spiking Neural Network on Flexible Substrate. IEEE Sensors Letters. 2023. 7. 5. 1-4
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Yuto Kaneiwa, Kazunori Kuribara, Takashi Sato. Aging-robust amplifier composed of p-type low voltage OTFT and organic semiconductor load. Japanese Journal of Applied Physics. 2023. 62. SC. SC1061-SC1061
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Yasuhiro Ogasahara, Kazunori Kuribara, Takashi Sato. Measurement of 64 organic thin-film transistors in an array test structure using a relay-switch board for efficient evaluation of long-term reliability. Japanese Journal of Applied Physics. 2023. 62. SC. SC1030-SC1030
ｍore...
MISC (22)：
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K. Oshima, M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, T. Sato. Experimental Study of Bias Stress Degradation of Organic Thin Film Transistors. International Conference on Solid State Devices and Materials (SSDM). 2019. 89-90
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大島 國弘, 齋藤 成晃, 新谷 道広, 栗原 一徳, 小笠原 泰弘, 佐藤 高史. 有機薄膜トランジスタの実測に基づくバイアス・ストレス劣化の要因とモデル化に関する検討. DA シンポジウム. 2019. 214-219
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Z. Qin, M. Shintani, K. Kuribara, Y. Ogasahara, T. Sato. OCM-PUF: An Organic Current Mirror PUF With Enhanced Resilience to Device Degradation. IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS). 2019. P-47. XXX-YYY
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M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, T. Sato. A Compact Model of I-V Characteristic Degradation for Organic Thin Film Transistors. IEEE International Conference on Microelectronic Test Structures (ICMTS). 2019. 194-199
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M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, T. Sato. Measurement and Modeling of Frequency Degradation of an oTFT Ring Oscillator. IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT). 2018. 1-6
ｍore...
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