Art
J-GLOBAL ID：201802211234593092
Reference number：18A0949415
Desorption and ionization of organic molecules induced by water cluster ion collision
水クラスターイオンビーム照射による有機分子の脱離イオン化
Author (4)：
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Material：
Issue：
OQD-18-022-030 光・量子デバイス研究会
Page：
35-38
Publication year：
Mar. 28, 2018
JST Material Number：
Z0924B
Document type：
Proceedings
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Applications of electron beams and ion beams
, Electron scattering by molecules
Reference (7)：
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N. Toyoda, J. Matsuo, T. Aoki, I. Yamada and D. B. Fenner : ′′Secondary ion mass spectrometry with gas cluster ion beams′′, Nucl. Instrum. and Meth. B, Vol.190, pp.860 (2002)
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S. Ninomiya, Y. Nakata, K. Ichiki, T. Seki, T. Aoki and J. Matsuo ′′Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions′′, Nucl. Instrum. and Meth. B, Vol.256, p.493 (2007)
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K. Mochiji, M. Hashinokuchi, K. Moritani and N. Toyoda : ′′Matrix-free detection of intact ions from proteins in argon-cluster secondary ion mass spectrometry′′, Rapid Commun. Mass Spectrom., Vol.23, No.5 pp.648-652 (2009)
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J. C. Vickerman and I. S. Gilmore : ′′Surface Analysis - The Principal Techniques 2nd Edition′′, pp.149 (2009)
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S. Sheraz, A. Barber, J. S. Fletcher, N. P. Locker and J. C. Vickerman : ′′Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams′′, Anal. Chem., Vol.85, No.12, pp.5654-5658 (2013)
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